I am working on ways to optimize the set of vectors that are used to test a circuit. In particular, I am looking at the circuit 'color converter'. I am trying to find ways to sort vectors that could be used for testing the circuit based on the number of faults they detect and their criticalities. Then I am looking to see if the faults are still detected when a set of vectors is chosen from the new list. I am comparing my results to those of one of the grad students, who generated her own list of vectors from best to worst through her own algorithm.